[seminar] Seminar FO, Holy

[hbuljan at phy.hr]

Poštovani kolege,

Podsjećam na današnje predavanje.

Srdačan pozdrav,
Hrvoje Buljan

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SEMINAR FIZIČKOG ODSJEKA
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Vrijeme:   ponedjeljak, 25. 01. 2010., 14:15 sati (točno)
Mjesto:     Fizički odsjek, Bijenička c. 32, predavaonica F201

   HIGH-RESOLUTION X-RAY DIFFRACTION AND DIFFUSE
    SCATTERING FROM DEFECTS IN EPITAXIAL LAYERS

                Václav Holý

Department of Condensed Matter Physics, Faculty of Mathematics and
Physics, Charles University in Prague, Czech Republic


High-resolution x-ray diffractometry is a powerful tool for the
investigation of structural properties of epitaxial thin layers,
especially for the study of structural defects such as small precipitates
of foreign phases and stacking faults, misfit and threading dislocations
and mosaic blocks. In the talk, the principles of the method will be
presented along with basic theoretical concepts describing the scattering
processes from various defect types. A row of experimental examples will
be presented including magnetic precipitates in magnetic layers Ge(Mn),
(Ga,Fe)N and (Ga,Mn)As, defect in implanted semiconductor layers, misfit
and threading dislocations in graded SiGe epitaxial buffers and complex
defects in c-oriented wurtzite GaN epitaxial layers.


				Voditelj seminara FO
				Hrvoje Buljan, hbuljan at phy.hr
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